Flying Probe systems require no test fixtures, have few restrictions on board access, and can test boards with a virtually unlimited number of networks. Operating in hundreds of plants across the world, Acculogic's Sprint 4510 has been selected by original equipment manufacturers (OEM s) and electronic manufacturing service (EMS) companies alike to meet their most demanding operational requirements. Sprint features four identical probes, and is capable of precision analogue tests, Power-off Open Pin Detection various devices, board power on tests, Boundary scan (JTAG) tests and mixed signal function test using external instruments. Sprint's advanced architecture, based around 3-phase linear platen motors with air bearings, allows high speed testing while being completely wear-free.

Surface linear motor systems with freedom of movement in X and Y directions provide the most advanced architecture for flying probe testers. Sprint’s monoplanar head arrangement allows four identical probes to contact target boards with high precision and at an optimal probing angle. Precise surface linear motors independently move the four, equal-length, equal angle probes on the same plane over the Unit Under Test (UUT). A precisely controlled air gap separates motors from platens, thus providing true wear-free operation. Similar to stepper motors, linear platen motors require no feedback and operate with precision. All probes have equal geographic accessibility to the board. Better fault coverage is obtained through increased flexibility in probe usage.

• Standard dual Boundary Scan ports
• High-speed boundary scan controller with fully programmable TCK rate
• Standard Digital I/O lines
• Optional additional boundary scan controlled digital I/Os
• Boundary scan infra-structure test
• Interconnect test, digital and analog cluster test, memory test
• Flash and in-system device programming (ISP)

About Boundary Scan

Advanced Function Test expands the capabilities of the Sprint 4510 beyond basic manufacturing process test. External commercially available instruments integrate directly with the Sprint 4510 and signal lines are routed to fixed or flying probes through software control. Each instrument's graphical user interface (GUI) provides an intuitive representation of the instrument controls and functions. Configuring instruments for a measurement is as simple as setting the dials. Once the parameters for a particular measurement are configured, program steps within the Sprint 4510 environment flow seamlessly. Instrument drivers are based on Interchangeable Virtual Instrument (IVI) protocols thus allowing easy and fast instrument replacement.

• Dual Instrument Rack - 19 inch
• Support for PCI, PXI, GPIB and USB2.0 programmable instruments
• Precision low noise auto-ranging modular power supplies
• Standard support for up to 4 user power supplies, expandable as required
• Voltage ranges of 5V to 60V and current ranges of 1A to 20A per power supply
• Series/parallel wiring of power supplies provides up-to 240V or 80A
• 25 different power supply modules to choose from
• Quick replacement of power supply units
• Full programmability from power supply GUI or Sprint 4510 software environment
• Digital Storage Scope - 100 MHz, 1 GS/s, programmable from Sprint 4510 GUI and instrument front panel
• Arbitrary Waveform Generator - 20 MHZ, programmable from Sprint 4510 GUI and instrument front panel
• Test resources routed to Flying and Stationary probes
• Vision controlled fixed probe placement
• Power-on mixed signal testing
• IVI drivers and technical support for user selected instruments

Sprint 4510 is designed for programming speed - board CAD data can be turned into a working test program in just a few hours. Rapid test program development starts with the Sprint's easy to use, intuitive graphic user interface and Automatic Program Generation (APG) software. Fully integrated CAD translation software is used to generate the test program data directly from most common CAD packages or Gerber files. Where CAD files or Gerber data are not available, test programs can be generated manually using a populated sample of the product to be tested. The program development process is controlled through a graphic flow diagram. Program generation is automatic and often requires minimum debugging. The circuit analysis soft ware identifies parallel components, assigns guard points automatically, and deals with many circuit configurations.

Automatic Program Generation software:

• Step by step guided automatic program generation scheme
• Support for 40 plus industry standard CAD formats
• Review board testability and circuit access
• Correction of CAD and addition of ECO data
• Topology driven automatic guard generation
• Device Library management software
• Dual sided program optimisation

Test Debug Tools:

• Powerful intuitive debugging environment
• Changeable measurement mode
• Stop-on fail, repeat, and loop
• Measure and stimulus swapping
• Measurement delay setting
• Global and step specific probe setup
• Graphical topology navigator

Test Coverage Reporter:

• Generates a comprehensive coverage report
• Partitions the coverage report by device types and test methods
• Drill downs reporting from category to device to device pin
• Integrates top and bottom side test coverage
• Accumulates and logs measurement data

Production Test Software:

• Password protected user administration
• Flexible data collection and log files
• Statistical Process Control Tools
• Bar Code reader
• Board Marking System
• Graphical Repair station software
• Multicolor ticket printer

Acculogic Open-Pin-Detect (OPD) toolset for power-off “Vectorless” detection of open pins on digital and mixed-signal devices is an important test capability. OPD provides fast programming and comprehensive manufacturing process fault coverage. D-Scan and C-Scan Vectorless tests extend fault coverage to any IC, including BGAs and ICs with heat sinks, as well as connectors and polarized capacitors. D-Scan, which is available on any combination of Flying and Fixed probes, uses protection (parasitic) diodes built into many devices to test failing pins. One stationary probe is required per power supply node. C-Scan is available on all four Flying heads and uses a capacitive coupling technique to check for open pins on ICs with no protection diodes. It can be used to check for opens on connectors and orientation of polarized capacitors. Each C-Scan probe assembly includes one retractable capacitive sensor.

Sprint's Motion Optimiser gives the programmer the ability to sort tests into logical groups for debugging, then resort the steps to a production ready lean runtime format. The Sprint4510 with its Tandem Test Mode (TTM) enable the machine to perform up to six measurements with one movement of the 4 flying probes. With the addition of "SpeedPlus", which involves engaging bottom side fixed position probes when performing analogue tests, this number increases by four with every additional fixed probe such that by adding nine fixed probes the tester can effectively test up to 42 steps with only one movement.

Sprint 4510 Fault Coverage Reporter automatically analyses board topology and the test program, and reports on the effectiveness of the test. The coverage report starts with a summary by component type, test technique and status of test. The drill down capability allows users to examine each device on a pin-by-pin basis, thus providing a full view of the overall program fault coverage. Sprint 4510 also includes Vision Test, which automatically inspects for presence, absence, and orientation of ICs, bypass capacitors, and components that are not electrically testable. Vision Test is fully integrated with the Sprint 4510 APG and enhances overall fault coverage.

StatManagerSPC software is a powerful statistical process control (SPC) tool that analyzes and identifies variations in test results due to variations in process environment. Using a series of measurements made repeatedly on a single board or on batches of production boards, developers are able to identify measurements that are least stable. They can then examine these measurements for root causes of instability and then alleviate these causes. StatManagerSPC allows developers to analyze test variance due to noise, component variation, drift, and system variance. Test limits can be updated automatically under user control to obtain solid production-ready tests.

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