iTest is suitable as a Functional, In-Circuit and Combinational Test Solution, which can easily be configured to test PCBs, complete assemblies or individual devices.

The architecture allows for a complete mix of test technologies in the solution that suit rapid deployment applications as well as high volume testing.

The key features of an iTest Solution are:

• Flexible for many testing types
• Mass Interconnect interface comes as standard
• 16U of rack space (single bay) up to 32U
• Suitable for use with 3U & 6U PXI modules, LXI, USB, GPIB and more