iTest ST - Semiconductor Test System
- Semiconductor device test system
- Standard IC as well as ASIC and FPGA testing
- A/D and D/A testing
- Video acquisition / playback applications
- High speed, bi-directional bus testing / emulation
- Test rates up to 100MHz
- Multiple Interface / Fixture options
GX5295 - Dynamic Digital I/O PXI Card
- 100MHz vector rate
- High performance pin electronics with per channel programmablility
- Per channel parametric measurement unit
- Drive / sense voltage range of -2V to +7V
- 32 input / output channels, dynamically configurable per channel
- 4 control / timing channels with programmable levels
- 256MB of on board vector memory
GX3500 - Digital I/O FLEX FPGA PXI Card
- User configurable, on-board Altera Cyclone III FPGA device
- Module software is fully compatible with Altera object files
- No proprietary FPGA design rools required
- Compatible with Altera's free web-based Quartus II design tools
- 160 digital I/O signals available for application support
- Accommodates explansion boards for custom applications
- 3U PXI instrument
GX1200 - Arbitrary Function Generator PXI Card
- 50 MS/s (GX1200) and 100 MS/s (GX1201) sample rates
- 10 digits sample clock frequency setting limited by 1 μS/s
- 1 ppm clock accuracy and stability
- 14-bit vertical resolution
- 2 M samples memory depth
- Multiple instrument synchronisation
- Ultra-fast waveform downloads using DMA
GX2472 - Dual Channel Digitiser PXI Card
- Two channel, 14 Bit Digitiser
- Differential or single ended inputs
- DC to >50 MHz analogue bandwidth
- 1V to 20Vpp full scale
- AC or DC coupling
- Excellent dynamic range and low distortion
- 3U PXI instrument