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ScanMaster PXI - PXI Based Boundary Scan / JTAG Test Controller

Key Features
  • High performance plug & play PXI based controller
  • JPXI™ 32-bit JTAG (IEEE 1149.1) bus controller
  • Fast throughput of up to 25 Mbits/sec
  • 100 MHz system clock and up to 25 MHz programmable TCK rate
  • Adaptive Clocking™ technology
  • 32 general purpose fully programmable parallel I/O channels
  • Multi-page cache memory behind TDI/TDO
  • Performs non-compliant test access port (TAP) operations
  • Meets addressable scan port (ASP) requirements
  • Supports standard vector formats SVF, JAM/STAPL, and IEEE 1532
ScanMaster PXI is a powerful, high speed JTAG (IEEE 1149.1) controller designed for use in a standard PXI chassis for design verification, production test, and on-board device programming applications. Utilising its proprietary JPXI™ bus-master with high speed cache memory behind TDI and TDO, Adaptive Clocking™ technology, and a 32-bit bus architecture, ScanMaster PXI eliminates bottlenecks to data delivery. This is critical to applications like Flash programming where large amounts of data must be processed and delivered. From the exchange of data with the host computer through to delivery of vectors to targets, ScanMaster PXI™ has been designed for high bandwidth, which enables delivery of data at speeds up to 25 Mbits/Sec.
Adaptive Clocking™
Adaptive Clocking eliminates instabilities typically associated with boundary scan (JTAG) operation at high clock rates (TCK) due to path delays. This proprietary and patented design compensates for path delays allowing the JPCI controller to operate at the maximum TCK rate supported by the target devices, and with up to 15 meters of cable between the JPCI controller and target devices. Without Adaptive Clocking, users are forced to either reduce cable length, leading to impractical set-ups which pose extreme limitation on application of Boundary Scan in a real production environment, or reduce TCK rate, which will in turn reduce throughput.

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