Automatic Test Equipment (ATE), PXI, Functional & In-Circuit PCB Test – Terotest UK

BOUNDARY SCAN TEST TOOLS

PRODUCTS Functional Test SystemsDigital Functional TestersIn-Circuit Test SystemsPXISemiconductor Test SystemsFlying Probe Test SystemsBoundary Scan Test SolutionsCable and Backplane TestersTest ModulesATE Interface ReceiversLegacy Replacement ATECAD Conversion SoftwareFPGA VerificationPre-Owned ATE SERVICES Custom Test SolutionsATE ServiceTest ProgrammingLASARTest FixturesTerotest Design ServicesTest Consultancy
Home >  Products >  Boundary Scan >  Boundary Scan Controllers > 

ScanBox - Boundary Scan / JTAG Test Platform

Key Features
  • 32-bit Boundary Scan controller, Supports IEEE1149.1 & .6 standards
  • Supports test and device programming
  • Fast throughput of up to 25 Mbits/sec
  • 100 MHz system clock with programmable TCK rate
  • Adaptive Clocking™ technology
  • 9 general purpose fully programmable parallel I/O channels
  • Delivers standard vector formats SVF, JAM/ STAPL, IEEE1532
  • Drive Level = 1.65V to 5.0V (1.65V, 1.8V, 2.5V, 3.3V and 5V)
  • TCK = 100KHz to 25MHz (with 10KHz resolution)
  • Configurable to access multiple scan chains (up-to 16)
ScanBox is the next generation Boundary Scan (JTAG) test platform. Based on Acculogics high performance JPCI 32-bit TAP controller chip with Adaptive Clocking Technology, ScanBox's built-in Ethernet and USB2 provides the flexibility and performance required for Remote Distributed Testing (RDT) - essential for applications such as design validation, environmental tests, automated factory test, repair and calibration. ScanBox combines built-in Boundary Scan controller and PC-standard connectivity with the modularity and size reduction of card cage-based systems. ScanBoxs compact, flexible package, high-speed data rates and reliable operation meet the needs of R&D and manufacturing and test engineers delivering electronics for the aerospace/defense, automotive, industrial, and medical and consumer electronics markets.
Adaptive Clocking™
Adaptive Clocking eliminates instabilities typically associated with boundary scan (JTAG) operation at high clock rates (TCK) due to path delays. This proprietary and patented design compensates for path delays allowing the JPCI controller to operate at the maximum TCK rate supported by the target devices, and with up to 15 meters of cable between the JPCI controller and target devices. Without Adaptive Clocking, users are forced to either reduce cable length, leading to impractical set-ups which pose extreme limitation on application of Boundary Scan in a real production environment, or reduce TCK rate, which will in turn reduce throughput.
Remote control and distributed testing is essential for Boundary Scan (JTAG) applications such as design validation, environmental tests, automated factory test, repair and calibration. ScanBox is based on industry standard Ethernet technology which has a wide general acceptance. Advantages of using Ethernet include TCP/IP error checking, fault detection and long inter-device connectivity. Ease of cable routing and inexpensive networking hardware. Ethernet enables the ScanBox to be deployed in a local, intranet or internet based distributed environment.
ScanNavigatorâ„¢ Run Time Environment (RTE) features a comprehensive Graphical User Environment (GUI) for ScanBox setup and runtime control. Through the ScanNavigator RTE, ScanBox executes boundary scan test and on-board programming routines and can easily be set up to perform conditional looping and branching operations - a critical feature for program debug and execution of diagnostic routines. ScanBox can also be controlled through DLL calls using test executives such as National Instruments' TestStand and Teradyne's TestStudio, or through direct API access with language-based programming.

If you require further information regarding this or any other product, please detail your query in the form below.

Tel: +44 (0) 1462 742499
Fax: +44 (0) 1462 742497
Email: info@terotest.com
Name *


Email *


Company *


Enquiry *


(* indicates a required field)

© 2010, Terotest Systems Ltd. Registration No. 4303797 Top Site Map Contact Us