Home >
Products >
Boundary Scan >
Boundary Scan Controllers >
ScanBox - Boundary Scan / JTAG Test Platform
Key Features
- 32-bit Boundary Scan controller, Supports IEEE1149.1 & .6 standards
- Supports test and device programming
- Fast throughput of up to 25 Mbits/sec
- 100 MHz system clock with programmable TCK rate
- Adaptive Clocking™ technology
- 9 general purpose fully programmable parallel I/O channels
- Delivers standard vector formats SVF, JAM/ STAPL, IEEE1532
- Drive Level = 1.65V to 5.0V (1.65V, 1.8V, 2.5V, 3.3V and 5V)
- TCK = 100KHz to 25MHz (with 10KHz resolution)
- Configurable to access multiple scan chains (up-to 16)
Description
ScanBox is the next generation Boundary Scan (JTAG) test platform. Based on Acculogics high
performance JPCI 32-bit TAP controller chip with Adaptive Clocking Technology,
ScanBox's built-in Ethernet and USB2 provides the flexibility and performance required for
Remote Distributed Testing (RDT) - essential for applications such as design validation,
environmental tests, automated factory test, repair and calibration. ScanBox combines
built-in Boundary Scan controller and PC-standard connectivity with the modularity and
size reduction of card cage-based systems. ScanBoxs compact, flexible package,
high-speed data rates and reliable operation meet the needs of R&D and manufacturing
and test engineers delivering electronics for the aerospace/defense, automotive,
industrial, and medical and consumer electronics markets.
Adaptive Clocking™
Adaptive Clocking eliminates instabilities typically associated with boundary scan (JTAG) operation
at high clock rates (TCK) due to path delays. This proprietary and patented design compensates for
path delays allowing the JPCI controller to operate at the maximum TCK rate supported by the target
devices, and with up to 15 meters of cable between the JPCI controller and target devices. Without
Adaptive Clocking, users are forced to either reduce cable length, leading to impractical set-ups
which pose extreme limitation on application of Boundary Scan in a real production environment, or
reduce TCK rate, which will in turn reduce throughput.
Remote Access and Distributed Testing
Remote control and distributed testing is essential for Boundary Scan (JTAG) applications such as
design validation, environmental tests, automated factory test, repair and calibration. ScanBox is
based on industry standard Ethernet technology which has a wide general acceptance. Advantages of
using Ethernet include TCP/IP error checking, fault detection and long inter-device connectivity.
Ease of cable routing and inexpensive networking hardware. Ethernet enables the ScanBox to be
deployed in a local, intranet or internet based distributed environment.
ScanBox Operating Environments
ScanNavigatorâ„¢ Run Time Environment (RTE) features a comprehensive
Graphical User Environment (GUI) for ScanBox setup and runtime control. Through the ScanNavigator RTE,
ScanBox executes boundary scan test and on-board programming routines and can easily be set up to
perform conditional looping and branching operations - a critical feature for program debug and
execution of diagnostic routines. ScanBox can also be controlled through DLL calls using test
executives such as National Instruments' TestStand and Teradyne's TestStudio, or through direct
API access with language-based programming.
More Information
If you require further information regarding this or any other product, please detail your query in the form below.

