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LEGACY ATE REPLACEMENT WITH TEROTEST'S NEW iTest-df


The New iTest-df ATE from Terotest has been designed to replace out of date "Legacy" Automatic Test Systems and also offers a cost effective, high performance solution for new test projects. iTest-df utilises Geotest LASAR post processing software to access the .tap output files from Teradyne's LASAR simulator for Go / No Go testing, as well as Guided Probe and Fault Dictionary files, allowing users to migrate test applications from Legacy platforms to the modern iTest platform.

iTest-df is a PXI based digital / analogue functional test system, capable of test rates up to 200MHz with Programmable Logic Levels.

We currently convert / rehost digital test applications deployed on Legacy test systems such as:

  • Teradyne L200, L300 and Spectrum 9100
  • Genrad GR179x, GR2750 and GR2225
  • Factron / Schlumberger 790
  • Hewlett Packard DTS-70
  • Others on request

iTest-df Hardware and Software

iTest-df is a modular platform which utilises high performance 6U PXI cards including Geotest's GX5055 and GX5290 series' cards, which are capable of test rates up to 200MHz and Programmable Logic Levels. Supporting such hardware modules is Geotest's DtifEasy software, a LASAR post processor, run time and diagnostic test solution.

iTest-df Datasheet
GX5055 Datasheet
GX7400A Datasheet
AX1553 Datasheet

DtifEasy Datasheet
GX5290 Datasheet
GTX2200 Datasheet
ScanMaster Datasheet

A full list of the available modules can be found here.

 


Please call or email us to receive further information on the iTest range available from Terotest, or to request a visit from one of our technical sales engineers.

+44 (0) 1462 742499

info@terotest.com

www.terotest.com


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