Flying Probe systems require no test fixtures, have few restrictions on board access, and can test boards with a virtually unlimited number of networks. Now available from Terotest is the Acculogic Flying Scorpion range, the first flying probe systems to feature double sided testing and a modular architecture expandable to accomodate 24 probes. Each probe is capable of Analogue, Digital, Boundary Scan and Vectorless tests, and can rotate between -6° and +6° in any vertical plane. The FLS900 features precise closed loop planar linear motors (shuttles) with AccuFast™ drive system (0.1 micron positioning resolution) which independently moves probe modules and cameras. The combination of shuttles positioning and joy-stick like probe motion ensures unmatched accessibility to points on the UUT.

Shrinking component sizes and denser chip scale packaging technologies are posing new challenges to test engineers. Test pads, traditionally installed on PCBs, are being eliminated from many designs thus reducing physical access. Flying Probers are required to operate with unprecedented precision in order to meet the new challenges. FLS900 uses highly repeatable closed loop linear motor drives and joystick-like variable angle probe modules to maximize physical access and guarantee repeatable probing of fine pitch devices and small components. FLS900 offers double sided probing and up to 24 probe modules both component and solder side of the UUT.

Due to its modular and scalable architecture, the FLS900 guarantees superior probing precision and repeatability. Precise Closed Loop planar linear motors (shuttles) with "AccuFast™ Drive System" (±0.1 micron positioning resolution) independently move probe modules and cameras. The probe modules utilise equal-length identical probes to contact target points on the UUT. Each probe module is able to set the probing angle from 0° to 6° from vertical in any direction. The combination of shuttles' positioning and joy-stick like probe motion ensures unmatched accessibility to points on the UUT. You can now test boards whose layout, size, and technology defy testing on traditional in-circuit and other moving probe testers.

Warping of printed circuit boards is a common issue that should be taken into account in SMT board assembly, inspection and test processes. During Flying Probe test, board warp changes the physical position of target points by an offset. When probing angle is 0 degrees from vertical, board warp will cause no probing errors, however, as the probing angle increases, the probing error also increases. A 0201 chip on a board with 0.5 mm warp using 15 degree probing angle cannot be probed dependably. Decreasing probing angle to 3 or 4 degrees reduces warp related uncertainty, and leads to increased probing reliability.

Closed Loop Drives for shuttles and probe modules ensure precise and repeatable positioning of the probes. Riding on 12 micron air gap, shuttles travel free of friction and with no mechanical contact on the stator plane and therefore operate free of wear. High resolution fiducial detection cameras, precise lighting, and advanced image processing software ensure precise and repeatable detection of fiducial marks on the UUT as well as correct compensation for any offsets. The electronic measurement system relies on precision circuits and components for reliable and repeatable measurements, while Integrator Pro™ system control software with sophisticated motion control and measurement algorithms ensures robust and repeatable operation. The high speed and precision analogue measurement unit provides 4-wire measurements capability for all 24 flying probes (top and bottom sides), and all probes can perform in-circuit tests as drivers, sensors, or guards on discrete and integrated analogue/digital components.

• Significantly faster than open loop systems (4x)
• Enhanced probing accuracy
• Automatic orthogonality between X and Y axis
• Sensorless homing (no adjustments)
• DSP based motor controller
• Built-in linear and parabolic interpolation (more efficient shuttle movements)
• Low energy usage (50% reduction)

The FLS900 has a modular architecture that is expandable to 24 probes. The probe modules have easily interchangeable probe tips, a range of which are available off the shelf. In addition to providing excellent test coverage on densely populated circuit boards, this flexibility makes the FLS900 an ideal solution for testing backplanes where direct contact with connector pin tips is required. FLS900 systems can be configured with Acculogic's patented Multi-nail Probe Module (MPM) which provides the functionality of a small bed-of-nail access in the flying probe system, and can be used in functional, digital, boundary scan (JTAG) testing and more.

High speed (up-to 1000 measurements/sec) and precision analogue measurement system provides 4-wire measurements capability for all 24 flying probes (top and bottom side). All probes can perform in-circuit tests as drivers, sensors, or guards on discrete and integrated analogue/digital components. Analog testing of resistors, capacitors, inductors, diodes, Zeners, transistors, FETS, thyristors, opto-couplers, switches, trimmers, relays, fuses and connectors is available on the FLS900. These include 2-wire and 4-wire tests, device ON and OFF tests using two sets of separately available stimulus/measurement resources. Also, power-on testing for voltage regulators and operational amplifiers are possible using the voltage measurement module.

• Automatic program generation software
• Built-in Boundary Scan (JTAG)
• Automatic multi-level guard assignment
• Auto-debug (unattended)
• Test Sequence with logical flow control
• Interactive board description editor add/modify test points, package etc.
• Panelization support
• Program and motion optimization
• Powerful Script language for functional and advance testing
• Test coverage report generation
• Statistical Process Control (SPC)
• RepairMatic™ graphical repair station software

Test program generation for FLS900 testers is highly automated, simple, and intuitive. The process starts by using the XMATIC™ software to translate UUT data from any of the 35-plus commonly used CAD formats. CAD data is merged with the Bill ofMaterials, and other relevant information to create an output file that contains data elements required to automatically generate test programs. Integrator Pro is the automatic test program generator (ATPG) and operating software that manages all aspects of test program sequencing, debugging, optimizing, and execution on the Flying Scorpion. The Integrator Pro also manages all physical resources of the tester including motion, vision, electrical stimulus and measurement. Integrator Pro supports many different plug-in modules such as Boundary Scan, BodeScan and FlashScan etc. which enhance test coverage and increase execution speed. An easy-to-use scripting language opens up internal resources of the tester, providing users with maximum flexibility to write complex test protocols with simultaneous use of multiple probe modules. The Integrator Pro is also equipped with an impressive set of tools for statistical process control, test execution flow management, and test coverage report generation. Interfaces to automatic repair processes, and automatic test program management (version control) are available.

PinScan™ is a complimentary suite of analogue and digital test techniques for detecting Opens on ICs, including BGAs, as well as connectors and polarized capacitors. CScan™ is a patented technique used in vectorless testing of ICs and connector pins. CScan is used to test open pins as well as the polarity of electrolytic capacitors. CScan functionality detects open pins on devices located on the top and/or bottom side of the board. ChipScan™ is a patented 3-pin technique for vectorless open testing on digital IC pins. It exploits the parasitic diodes/transistors in each digital IC, and tests each pin for open faults. Power up is not required in order to use ChipScan. This method is particularly useful where bus structures are used. ChipScan detects wire bonding defects, open pins and cold joints. ChipScan functionality is available on all probes covering top and bottom side of the unit under test. ScanProbe™ is a digital technique that uses flying probes to detect opens on digital IC pins of devices that are IEEE-1149.1(JTAG) compliant. ScanProbing is fast and repeatable, uses the digital and boundary scan capability of the FLS900 for fault detection.

• Fully integrated hardware and software
• IEEE1149.1 and IEEE 1149.6 supported
• Support for up to 8 scan chains
• Scan and non-scan testing
• Automatic test optimization
• Automated test generation and intelligent diagnostics
• Dramatic increase in test coverage

About Boundary Scan

• Multi-camera dual sided vision system
• Advanced image processing software
• Vision inspection for presence, absence and orientation of components
• Up-to 8 (4 top/4 bottom) high resolution CCD cameras
• Flexible target illumination
• 1D and 2 D bar code reader
• Optical Character Recognition (OCR)

Programmable devices such as PLDs, Flash, PROMs are frequently used on most modern circuit board assemblies. In-production-programming (configuration) of these devices provides the flexibility for on-the-fly content changes as opposed to using pre-programmed parts. Device Programming on the FLS900 improves production efficiency by removing an extra step in the production process. FlashScan™ is a multi-vendor integrated hardware and software suite that provides the FLS900 with capability to program and verify a wide range of devices.

Integrator Pro's SPC software is a powerful statistical process control (SPC) tool that analyses and identifies variations in test results due to variations in process environment. Using a series of measurements made repeatedly on a single board or on batches of production boards, developers are able to identify measurements that are least stable. They can then examine these measurements for root causes of instability and alleviate the causes. SPC software allows developers to analyze test variance due to noise, component variation, drift, and system variance. Test limits can be updated automatically under user control to obtain solid production-ready tests.

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Tel: +44 (0) 1462 742499
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